Patent · US Active

Inspection apparatus

US10352869B2 · kind B2 · utility

1Cited by
2References
9Claims
0Family size

Assignee

Inventor

Key dates

Filing dateOct 5, 2017
Grant dateJul 16, 2019
Priority date
Expiry dateOct 27, 2037

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06T2207/10152
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

An inspection apparatus includes an illumination device including an arch-like lighting unit that is provided around an inspection target in a circular arc form and emits light toward the inspection target, imaging devices that capture images of a light reflection surface of the inspection target by which the light emitted from the arch-like lighting unit is reflected, and a determination device that inspects the light reflection surface of the inspection target on the basis of the images captured by the imaging devices. As a result, the inspection apparatus provides an effect of preventing the apparatus from being increased in size.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.