Patent · US Active

Apparatus, method, and program for component measurement

US10352950B2 · kind B2 · utility

7Cited by

0References

20Claims

0Family size

Assignee

Terumo Kabushiki Kaisha · JP

Inventors

Shouji Ochiai · Yamanashi, JP
Takeyuki Moriuchi · Yamanashi, JP
Masao Takinami · Showa, JP

Key dates

Filing date	Sep 9, 2016
Grant date	Jul 16, 2019
Priority date	—
Expiry date	Jun 16, 2037

Classification

Technology area (CPC G)Physics
CPC primaryG01N2333/908
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

Provided is a component measuring apparatus configured to determine a functional form that describes wavelength characteristics of a variation attributable to scattering (S (λ)). The apparatus then determines unknown one or more coefficients (p, q) based on a first relational expression that involves a variation attributable to absorption (H (λ1)) and a group of second relational expressions that do not involve variations attributable to absorption (H (λ2a), H (λ2b), H (λ2c)). The apparatus then corrects an absorbance measured at an arbitrary wavelength (λ) using a function where the one or more coefficients (p, q) are applied to the functional form so as to reduce or eliminate at least the effects of scattering of light.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.