Circular scanning technique for large area inspection
US10353191B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jan 13, 2016 |
| Grant date | Jul 16, 2019 |
| Priority date | — |
| Expiry date | Mar 4, 2036 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04N1/00018
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
Described embodiments provide a method of generating an image of a region of interest of a target object. A plurality of concentric circular scan trajectories are determined to sample the region of interest. Each of the concentric circular scan trajectories have a radius incremented from an innermost concentric circular scan trajectory having a minimum radius to an outermost concentric circular scan trajectory having a maximum radius. A number of samples are determined for each of the concentric circular scan trajectories. A location of each sample is determined for each of the concentric circular scan trajectories. The locations of each sample are substantially uniformly distributed in a Cartesian coordinate system of the target object. The target object is iteratively rotated along each of the concentric circular scan trajectories and images are captured at the determined sample locations to generate a reconstructed image from the captured images.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.