Feature classification with spatial analysis
US10354134B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Aug 28, 2017 |
| Grant date | Jul 16, 2019 |
| Priority date | — |
| Expiry date | Jan 2, 2038 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06V30/418
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Methods, non-transitory computer-readable storage mediums and systems for classifying features including labels or fields in digital images of forms and identifying any unclassified features utilizing a bitmap approach are provided. Each spatial template includes a set of features and a set of bitmaps, each bitmap indicating a spatial relationship between each feature and respective remaining features in each spatial template. The operations include selecting a spatial template from the spatial templates, classifying each extracted feature as one of features in the spatial template. The operations include generating at least one bitmap representing a spatial relationship for each unclassified feature in relation to classified features, comparing the at least one bitmap with each of a set of bitmaps in the selected spatial template, and identifying the at least one unclassified feature as one of features in the spatial template based on a result of the comparison.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.