Quality prediction
US10354210B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Apr 16, 2015 |
| Grant date | Jul 16, 2019 |
| Priority date | — |
| Expiry date | Apr 16, 2035 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06Q10/06313
- WIPO fieldIT methods for management
- WIPO sectorElectrical engineering
Abstract
A set of predicted binary quality indexes is created from a sample set of application lifecycle information and customer encountered defects (CED) for each module id and revision (rev) pair for each application. Normalized effort and quality related factors are extracted for each module id and rev pair of each application. A binary quality index is created based on a set of weighted CED ratings for each module id and rev pair of each application. A prediction model for the binary quality index is created by training a decision tree-based classifier with the sample set to create a set of prediction weights for each effort and quality factor. The set of prediction weights is applied to the effort and quality related factors to each module id and rev pair of an application under-development to create the set of predicted binary quality indexes.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.