Patent · US Active

Omnidirectional roughness algorithm for topographic signature analysis of lunar craters

US10354398B2 · kind B2 · utility

0Cited by

1References

19Claims

0Family size

Assignee

Macau University of Science and Technology · CN

Inventors

Zhanchuan Cai · Taipa, CN
Wei Cao · Shanghai, CN

Key dates

Filing date	Dec 1, 2016
Grant date	Jul 16, 2019
Priority date	—
Expiry date	Jun 4, 2037

Classification

Technology area (CPC G)Physics
CPC primaryG06T2207/30184
WIPO fieldComputer technology
WIPO sectorElectrical engineering

Abstract

A method executed by a computer system to construct an omnidirectional roughness (OR) map of a lunar crater based on a data set of a digital elevation model (DEM) of surface textures of the lunar crater is provided. The method includes setting a center and a first point of the data set, selecting a moving window, utilizing a one point-to-point step when the moving window slides over the DEM, calculating a morphological surface roughness (MSR) that detects a vertical roughness of the lunar crater, calculating a topographic frequency coefficient (TFC) that detects a horizontal roughness of the lunar crater, constructing the OR map, and displaying the OR map to show a surface roughness of the lunar crater.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.