Semiconductor device and electronic apparatus
US10355036B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Feb 18, 2016 |
| Grant date | Jul 16, 2019 |
| Priority date | — |
| Expiry date | Feb 29, 2036 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01L2924/13091
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
The present disclosure relates to a semiconductor device and an electronic apparatus which is capable of reducing variations and deterioration of transistor characteristics.A first connection pad connected with a first wiring and a first floating metal greater than the first connection pad are formed at a bonding surface of a first substrate, whereas a second connection pad connected with a second wiring and a second floating metal greater than the second connection pad are formed at a bonding surface of a second substrate. The first joint pad and the second floating metal are connected to each other, the second floating metal and the first floating metal are connected to each other, and the first floating metal and the second joint pad are connected to each other, whereby the first floating metal and the second floating metal formed at the first substrate and the second substrate are bonded to each other. The present disclosure is applicable to a CMOS solid-state imaging device used for an imaging apparatus such as a camera, for example.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.