Apparatus and method for tracking defects in sheet materials
US10365228B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Feb 5, 2016 |
| Grant date | Jul 30, 2019 |
| Priority date | — |
| Expiry date | Feb 5, 2036 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2201/06113
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The present application relates to a tracking arrangement for the tracking of a material defect in a sheet material, such as a container material or a product-packaging material. The tracking arrangement may comprise a defect sensor, which is configured to detect a material defect in a sheet material moving thereby or therethrough. The tracking arrangement may also comprise a first structure sensor, which is configured to detect at least one inherent structural feature of the sheet material itself in the region of the material defect, as well as a control arrangement, which is configured to receive data from said first structure sensor.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.