Patent · US Active

Systems and techniques for determining the predictive value of a feature

US10366346B2 · kind B2 · utility

33Cited by
17References
30Claims
0Family size

Assignee

Inventors

Key dates

Filing dateOct 21, 2016
Grant dateJul 30, 2019
Priority date
Expiry dateOct 21, 2036

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06Q30/0201
  • WIPO fieldIT methods for management
  • WIPO sectorElectrical engineering

Abstract

A method for determining the predictive value of a feature may include: (a) performing predictive modeling procedures associated with respective predictive models, wherein performing each modeling procedure includes fitting the associated model to an initial dataset representing an initial prediction problem; (b) determining a first accuracy score of each of the fitted models, representing an accuracy with which the fitted model predicts an outcome of the initial prediction problem; (c) shuffling values of a feature across observations included in the initial dataset, thereby generating a modified dataset representing a modified prediction problem; (d) determining a second accuracy score of each of the fitted models, representing an accuracy with which the fitted model predicts an outcome of the modified prediction problem; and (e) determining a model-specific predictive value of the feature for each of the fitted models based on the first and second accuracy scores of the fitted model.

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