Systems and techniques for determining the predictive value of a feature
US10366346B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Oct 21, 2016 |
| Grant date | Jul 30, 2019 |
| Priority date | — |
| Expiry date | Oct 21, 2036 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06Q30/0201
- WIPO fieldIT methods for management
- WIPO sectorElectrical engineering
Abstract
A method for determining the predictive value of a feature may include: (a) performing predictive modeling procedures associated with respective predictive models, wherein performing each modeling procedure includes fitting the associated model to an initial dataset representing an initial prediction problem; (b) determining a first accuracy score of each of the fitted models, representing an accuracy with which the fitted model predicts an outcome of the initial prediction problem; (c) shuffling values of a feature across observations included in the initial dataset, thereby generating a modified dataset representing a modified prediction problem; (d) determining a second accuracy score of each of the fitted models, representing an accuracy with which the fitted model predicts an outcome of the modified prediction problem; and (e) determining a model-specific predictive value of the feature for each of the fitted models based on the first and second accuracy scores of the fitted model.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.