Apparatus and method for measuring temperature in electronic device
US10371577B2 · kind B2 · utility
1Cited by
3References
20Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Apr 6, 2016 |
| Grant date | Aug 6, 2019 |
| Priority date | — |
| Expiry date | May 26, 2037 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01J5/0846
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An apparatus and method for measuring a temperature in an electronic device. An amount of light of an optical signal reflected off of an object is measured, and a size of a temperature measurement expectation area on the object based is determined based on the measured amount of light. A temperature measurement guide message is output based on a result of comparing the determined size and a reference area.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.