Data correction method in fine particle measuring device and fine particle measuring device
US10371632B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Apr 3, 2013 |
| Grant date | Aug 6, 2019 |
| Priority date | — |
| Expiry date | Jan 23, 2036 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2015/1415
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
To provide a technique capable of highly accurately measure the intensity and the spectrum of fluorescence and scattered light by effectively correcting measurement error that occurs due to variation of flow positions of fine particles in a channel. A data correction method for a fine particle measurement device is provided, which includes an intensity detection procedure capable of detecting light generated from a fine particle by emitting light onto the fine particle flowing through a channel, and obtaining intensity information about the light, a position detection procedure capable of obtaining position information about the fine particle, and a correction procedure for correcting the intensity information on the basis of the position information.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.