Method and apparatus for measuring inelastic scattering
US10371641B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jan 20, 2017 |
| Grant date | Aug 6, 2019 |
| Priority date | — |
| Expiry date | Jan 20, 2037 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01J2001/442
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An apparatus, includes an illuminating light source and illuminating optics arranged to illuminate a sample region with illuminating light pulses, light gathering optics to gather Raman scattered light pulses from the sample region, a spectral disperser and a detector array for measuring the spectral intensity distribution of Raman scattered light pulses obtained from the sample region and an auxiliary detector for providing an indicator signal indicative of elastic scattering coefficient of the sample region. The apparatus is arranged to form a first output spectrum from the spectral intensity distribution of a first group of Raman scattered light pulses. The pulses of the first group of Raman scattered light pulses are obtained from the sample region when the indicator signal indicates that an object is located in the sample region.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.