Patent · US Active

Multi-layer anomaly detection framework

US10372120B2 · kind B2 · utility

2Cited by

8References

8Claims

0Family size

Assignee

General Electric Company · US

Inventors

Sundeep R Patil · Garching bei München, DE
Ansh Kapil · Munich, DE
Alexander Sagel · Blochingen, DE
Lutter Michael · Bayern, DE
Oliver Baptista · Innsbruck, AT
Martin Kleinsteuber · Bayern, DE

Key dates

Filing date	Oct 6, 2016
Grant date	Aug 6, 2019
Priority date	—
Expiry date	Dec 29, 2036

Classification

Technology area (CPC G)Physics
CPC primaryG05B23/0281
WIPO fieldControl
WIPO sectorInstruments

Abstract

According to some embodiments, a system and method are provided to receive a first plurality of data from a machine associated with a first time period. A normal operation of the machine is automatically determined based on the first plurality of data. A second plurality of data may be received from the machine associated with a second time period. An anomaly in the second plurality of data is determined.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.