Electronic device monitoring using induced electromagnetic emissions from software stress techniques
US10372587B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Nov 9, 2016 |
| Grant date | Aug 6, 2019 |
| Priority date | — |
| Expiry date | Aug 26, 2037 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY02D10/00
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A method involves using one or more software programs to stress a powered electronic device in a test environment to induce controlled electromagnetic emissions from the powered electronic device, using the controlled electromagnetic emissions to generate an emission profile of the powered electronic device operating under stress, monitoring spurious electromagnetic emissions of the powered electronic device in an operational environment, and comparing the spurious electromagnetic emissions of the powered electronic device in the operational environment with the emission profile of the powered electronic device to determine that the powered electronic device is operating under stress in the operational environment.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.