Thermal anomaly detection
US10375325B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Jun 23, 2016 |
| Grant date | Aug 6, 2019 |
| Priority date | — |
| Expiry date | Nov 26, 2036 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/10048
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Systems and methods can be used to detect thermal anomalies in a target scene of an infrared image. Acquired thermal image data can be compared to a statistical thermal profile to detect thermal anomalies in the image data. Anomaly data based on the comparison can be used to generate an image representing locations and/or severity of detected anomalies. Systems can be used to acquire thermal image data for generating and/or updating statistical thermal profiles for use in anomaly detection processes. Auxiliary measurement devices can provide measurement data representative of one or more parameters of the target scene. The measurement data can be used to select from a plurality of possible statistical thermal profiles associated with the target scene to best match the current parameters of the scene.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.