Testing system and method
US10379154B2 · kind B2 · utility
0Cited by
8References
16Claims
0Family size
Assignee
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Key dates
| Filing date | Sep 13, 2017 |
| Grant date | Aug 13, 2019 |
| Priority date | — |
| Expiry date | Sep 13, 2037 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/31924
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method, computer program product, computing system, and an automated test platform for testing at least one device under test includes a test head configured to receive the at least one device under test. A processing system is configured to: provide a voltage signal having a plurality of voltages to the at least one device under test, and monitor a current flow into the at least one device under test during each of the plurality of voltages, thus generating a plurality of monitored current values that correspond to the plurality of voltages. The plurality of monitored current values are stored.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.