Cell deterioration diagnostic based on integrated value
US10379170B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Feb 24, 2016 |
| Grant date | Aug 13, 2019 |
| Priority date | — |
| Expiry date | Feb 24, 2036 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/389
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Relatively inexpensive and practical cell deterioration diagnostic method and cell deterioration diagnostic device are provided. A cell deterioration diagnostic method diagnoses cell deterioration of a secondary cell having a transient characteristic. The method includes: a charging step of charging the secondary cell; a calculation step of calculating an integrated value of a potential difference obtained by subtracting a cell internal voltage V0 of the secondary cell from a cell inter-terminal voltage of the secondary cell by integrating the potential difference as the cell inter-terminal voltage converges to the cell internal voltage V0 after completion of charging; and a diagnosis step of diagnosing the cell deterioration of the secondary cell based on the integrated value.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.