Data storage device read threshold adjustment according to environmental parameters
US10379739B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Mar 23, 2018 |
| Grant date | Aug 13, 2019 |
| Priority date | — |
| Expiry date | Mar 23, 2038 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11C29/028
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Embodiments of systems and methods for management and/or optimization of non-volatile memory read thresholds using improved time and temperature tagging are described. In some embodiments, time and temperature tagging can be optimized based on time that it takes to perform read threshold calibration, the expected change in temperature, and/or the impact of this change on bit error rate. In some embodiments, a model of an environmental parameter can be determined and associated read thresholds can be pre-calculated. If the measured environmental parameter is within a threshold of the model for the environmental parameter, a pre-calculated read threshold value can be used instead of performing read threshold calibration. Advantageously, power consumption can be reduced and throughput for the memory device can be increased.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.