Method for computing self-contamination processes of a spacecraft
US10380219B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Nov 13, 2015 |
| Grant date | Aug 13, 2019 |
| Priority date | — |
| Expiry date | Jun 3, 2036 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F30/15
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A method for computing self-contamination processes of a spacecraft by means of a data processing device comprising the following steps: receiving a first set of input parameters comprising general definitions of the spacecraft, receiving a second set of input parameters comprising control parameters for the spacecraft orbital data, physics, numeric, and a predetermined accuracy requirement of the computation, computing a self-contamination process of the spacecraft based on the received first and second sets of input data by either evaluating the analytical solution of a basic equation of emission or numerically solving the basic equation of emission for calculating a deposit of molecules outgassed from surfaces of the spacecraft with a numerical solver with the data processing device, wherein the numerical solver applies an adaptive stepsize control based on the preset accuracy requirement of the computation, and outputting the calculated deposit.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.