Backscatter reductant anamorphic beam sampler
US10384152B2 · kind B2 · utility
0Cited by
5References
20Claims
0Family size
Inventor
Key dates
| Filing date | Jun 7, 2016 |
| Grant date | Aug 20, 2019 |
| Priority date | — |
| Expiry date | Feb 4, 2037 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2021/054
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Embodiments of the present invention include a backscatter reductant anamorphic beam sampler. The beam sampler can be implemented to measure a power of a reference beam generated by an electromagnetic radiation source in proportion to a power of a working beam. The beam sampler can provide astigmatic correction to a divergence of the working beam along one axis orthogonal to a direction of propagation. The beam sampler can further be implemented to prevent backscatter from impinging upon a photodetector of the beam sampler resulting in a reduction of error and instability in measurements taken by the beam sampler.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.