Apparatus and method for measuring thin material thicknesses in inventory management applications
US10386180B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Nov 28, 2016 |
| Grant date | Aug 20, 2019 |
| Priority date | — |
| Expiry date | Feb 14, 2038 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06Q10/087
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An apparatus includes a transmitter configured to transmit a signal including an electromagnetic pulse towards material in a tank. The apparatus also includes a receiver configured to receive a signal including multiple reflections of the pulse. The apparatus further includes at least one processing device configured to process the received signal and determine a measurement associated with the material in the tank. To process the received signal, the at least one processing device is configured to fit multiple models onto the received signal, select one of the models, identify at least one of the multiple reflections in the received signal using the selected model, and determine the measurement using the at least one identified reflection in the received signal. Each model is constructed from a superposition of multiple types of pulse reflections.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.