Sparkle measurement

US10386235B2 · kind B2 · utility

Assignee

• X-Rite Switzerland GmbH · CH

Inventors

• Peter Ehbets · Bellinzona, CH
• Guido Niederer · Zürich, CH

Key dates

• Filing date: May 22, 2018
• Grant date: Aug 20, 2019
• Expiry date: May 22, 2038

Classification

• Technology area (CPC G): Physics
• CPC primary: G02B21/367
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

A device for radiometrically gauging the surface of a measurement object (O) includes: at least one measurement array featuring an illumination array and a pick-up array; and a processor (P) for controlling the illumination array and the pick-up array and for processing measurement signals produced by the pick-up array and for providing processed image data. The illumination array exposes a region of the measurement object (O) to illumination light at an illumination angle (θi) and an illumination aperture angle (αi), and the pick-up array captures measurement light, reflected by the measurement object (O), at a pick-up angle (θv) and a pick-up aperture angle (αv) and guides it onto an image sensor exhibiting a pixel structure. The measurement object (O) is gauged multispectrally in multiple wavelength ranges, wherein the image sensor produces multispectral image data. Angular and spatial conditions are indicated which optimize the measurement device (MD) with regard to characterizing sparkles.