Device for measuring an imaging property of an optical system
US10386267B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | May 7, 2016 |
| Grant date | Aug 20, 2019 |
| Priority date | — |
| Expiry date | May 7, 2036 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01M11/0292
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A device for measuring the MTF or another imaging property of an optical system has a light pattern generating unit that generates a light pattern in a focal plane of the optical system. A reference axis of the device is oriented along an optical axis of the optical system. The device further comprises an arrangement of N, N=2, 3, 4, . . . , cameras that are separated from one another. Each camera has an objective and a light sensor that is arranged in a focal plane of the objective. The cameras are arranged on a side opposite the light pattern generating unit such that the light sensor of each camera detects an image of exactly one section of the light pattern. At least one beam deflecting element is arranged between the optical system and at least one of the cameras such that it deflects light away from the reference axis before the light impinges on the at least one camera.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.