System and method to measure capacitance of capacitive sensor array
US10386969B1 · kind B1 · utility
2Cited by
383References
20Claims
0Family size
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Key dates
| Filing date | Nov 7, 2012 |
| Grant date | Aug 20, 2019 |
| Priority date | — |
| Expiry date | Dec 7, 2032 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F3/04166
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A system and method for determining position information. The method includes selecting a column, a first row, and a second row of a capacitive sensor array. The first row and second row intersect with the column of the capacitive sensor array. The method further includes measuring a differential capacitance between the first row and the second row and utilizing the differential capacitance in determining a location of an object proximate to the capacitive sensor array.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.