Patent · US Active

Device and method for measuring workpieces

US10393505B2 · kind B2 · utility

2Cited by

12References

38Claims

0Family size

Assignee

WERTH MESSTECHNIK GMBH · DE

Inventors

Ralf Christoph · Schönberg (Holstein), DE
Ingomar Schmidt · Erfurt, DE
Benjamin Hopp · Gießen, DE
Sebastian Zoeller · Weilmünster, DE
Markus Hechler · Wetzlar, DE
Stefan Gruenwald · Gießen, DE
Andreas Ettemeyer · Grabs, CH
Sabine Linz-Dittrich · Schaan, LI
Matthias Andraes · Florstadt, DE

Key dates

Filing date	Dec 5, 2014
Grant date	Aug 27, 2019
Priority date	—
Expiry date	Feb 29, 2036

Classification

Technology area (CPC G)Physics
CPC primaryG01B11/03
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

The invention relates to a device and a method for tactile/optical measuring of geometric features and structures on a workpiece. In order to be able to precisely align the probe extension for performing precise measurements without problems, a probe is proposed comprising a probe extension (13) having a flexurally elastic design at least in segments and having a mounting segment for mounting in a receptacle (14) comprising a mounting segment (60) implemented as a rotational lock.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.