Techniques for magnetometer calibration using selected measurements over time
US10393824B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Dec 23, 2016 |
| Grant date | Aug 27, 2019 |
| Priority date | — |
| Expiry date | Dec 21, 2037 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R33/02
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Certain aspects of the present disclosure generally relate to magnetometer calibration. In some aspects, a device may obtain multiple sets of magnetic field measurements corresponding to multiple local magnetic field strengths, wherein each set of magnetic field measurements is measured in association with an unknown local magnetic field strength. The device may calculate multiple error values using the multiple sets of magnetic field measurements, estimated values of the multiple local magnetic field strengths, and estimated hard iron bias values. The device may identify a set of hard iron bias values for magnetometer calibration based at least in part on comparing the multiple error values. The device may calibrate a magnetometer using the identified set of hard iron bias values.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.