Optical testing of FK modulators for silicon photonics applications
US10394060B2 · kind B2 · utility
6Cited by
10References
9Claims
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Key dates
| Filing date | May 17, 2017 |
| Grant date | Aug 27, 2019 |
| Priority date | — |
| Expiry date | May 17, 2037 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG02F1/0157
- WIPO fieldOptics
- WIPO sectorInstruments
Abstract
An method for characterizing a modulator for fabricating a silicon photonics circuit and an apparatus (e.g., a silicon photonics wafer) made via the method are described. The method includes determining an absorption spectrum of a modulator and determining, based at least on the determined absorption spectrum, an operational bandwidth of the modulator. The method further includes selecting a laser for coupling with the modulator using the operational bandwidth of the modulator. In this way, the laser is selected such that it has an emission bandwidth that corresponds to the operational bandwidth of the modulator.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.