System and method to configure distributed measuring devices and treat measurement data
US10394759B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Mar 14, 2016 |
| Grant date | Aug 27, 2019 |
| Priority date | — |
| Expiry date | Feb 16, 2037 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04L67/1097
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A method to configure a measuring device is provided. In other aspects, a server and a non-transitory computer readable storage medium are provided. The method includes receiving a configuration request that specifies configuration criteria for configuring a measuring device to perform a test, wherein the configuration criteria includes configuration instructions, analysis instructions, and visualization instructions, and configuring the measuring device to perform measurements and output measurement data in accordance with the configuration instructions. The method further includes receiving the measurement data output by the measuring device, storing the measurement data received, processing the measurement data stored based on the analysis instructions, and outputting visualization data corresponding to the processed measurement data to a display device based on the visualization instructions.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.