Apparatus and method for detecting presence of attenuation in OLED device
US10396285B2 · kind B2 · utility
Assignees
Inventors
Key dates
| Filing date | Jun 30, 2017 |
| Grant date | Aug 27, 2019 |
| Priority date | — |
| Expiry date | Jun 30, 2037 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/2642
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An apparatus and a method for detecting presence of attenuation in the OLED device are provided. The apparatus for detecting presence of attenuation in the OLED device includes: a difference function construction circuit, an integrating circuit, a comparing circuit and a determining circuit. The method for detecting presence of attenuation in the OLED device includes: constructing a first light brightness difference function and a second light brightness difference function before and after aging, integrating the first function and the second function, comparing two integrals, and determining whether or not intrinsic attenuation is present in a light emitting material of a light emitting layer in the OLED device. The apparatus for detecting presence of attenuation in the OLED device is configured for executing the method for detecting presence of attenuation in the OLED device.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.