Apparatus and method for three dimensional surface measurement
US10397550B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Dec 16, 2013 |
| Grant date | Aug 27, 2019 |
| Priority date | — |
| Expiry date | Mar 13, 2036 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/10032
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
A system and method for three-dimensional measurement of surfaces. In one embodiment, a measurement system includes a laser projector, a first camera, and a processor. The laser projector is configured to emit a laser projection onto a surface for laser triangulation. The first camera is configured to provide images of the surface, and is disposed at an oblique angle with respect to the laser projector. The processor is configured to apply photogrammetric processing to the images, to compute calibrations for laser triangulation based on a result of the photogrammetric processing, and to compute, based on the calibrations, coordinates of points of the surface illuminated by the laser projection via laser triangulation.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.