Patent · US Active

Method for generating position data of an instrument

US10398512B2 · kind B2 · utility

3Cited by

1References

5Claims

0Family size

Inventor

Dirk Mucha · Berlin, DE

Key dates

Filing date	May 17, 2010
Grant date	Sep 3, 2019
Priority date	—
Expiry date	Jul 14, 2033

Classification

Technology area (CPC A)Human Necessities
CPC primaryA61M25/0105
WIPO fieldMedical technology
WIPO sectorInstruments

Abstract

A method for detecting deformations and errors and/or for generating position data of an instrument (1) with at least one first section (2) with at least one first sensor (4) and at least one second section (3) with at least one second sensor (5), wherein the method encompasses metrologically determining the position of the first and second sensor (4, 5). The method encompasses mathematically determining the position of the second sensor (5) with regard to the first section (2), preferably in at least two ways. Further, an apparatus for executing the method is specified.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.