Patent · US Active

Method for calibrating an optical arrangement

US10401145B2 · kind B2 · utility

2Cited by

4References

19Claims

0Family size

Assignee

Carl Zeiss Industrielle Messtechnik GmbH · DE

Inventors

Frank Hoeller · Aalen, DE
Oliver Paul · Freiburg im Breisgau, DE
Frank Widulle · Neu-Ulm, DE

Key dates

Filing date	Jun 5, 2017
Grant date	Sep 3, 2019
Priority date	—
Expiry date	Jun 7, 2037

Classification

Technology area (CPC H)Electricity
CPC primaryH04N7/18
WIPO fieldAudio-visual technology
WIPO sectorElectrical engineering

Abstract

A method for calibrating an optical arrangement for determining dimensional properties of a measurement object and a coordinate measuring machine implementing the method are disclosed. The optical arrangement has a camera and a projector for projecting a first periodic pattern onto a projection area. The optical arrangement is moveable relative to a workpiece table along a first axis. A matte surface is arranged on the workpiece table at a first position relative to the optical arrangement. A second periodic pattern, which is separate from the first periodic pattern, is provided and shifted on the matte surface. Images of the second pattern are recorded using the camera and at least one distortion aberration of the camera is determined using the second periodic pattern. The first periodic pattern is projected onto the matte surface and first and second coordinates of at least one pattern point of the projected first periodic pattern are determined, the second coordinate with respect to a second axis, which is perpendicular to the first axis. The matte surface is displaced relative to the optical arrangement to a second position along the first axis and the aforementioned steps are …

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.