Analysis method for supporting classification
US10401275B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Aug 5, 2014 |
| Grant date | Sep 3, 2019 |
| Priority date | — |
| Expiry date | Mar 10, 2035 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2800/26
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The invention relates to an analysis method for supporting classification, a determination method for determining analysis parameters Ys, Ei, Ii, σi for the analysis method, a computer program product, and an optical analysis system for supporting classification, with which system analysis parameters Ys, Ei, Ii, σi can be defined on the basis of first and second calibration data. The parameters provide classification support according to the discriminant analysis and on the basis of measured values Pi of optical characteristics i, in particular of organic dispersions, and the information content thereof for classification, in particular the diagnosis of disease; and permit a classification proposal or a diagnosis proposal in comparison with a threshold Ys.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.