On-center electrically conductive pins for integrated testing
US10401386B2 · kind B2 · utility
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10References
8Claims
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Key dates
| Filing date | Aug 29, 2016 |
| Grant date | Sep 3, 2019 |
| Priority date | — |
| Expiry date | Nov 15, 2036 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R1/07307
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A structure and method for providing a contact pin between a device under test (DUT) and a load board which provides upper and lower contact point which are axial aligned is disclosed. The pin has an upper (30) and lower (32) section and a hinge (44/46) in between which allow flex of both upper and lower contact (24/26) which, but the axial alignment can provide a direct replacement for POGO pins but with greater reliability. It also includes a structure and method for removing upper pins 230 by use of a modified hinge 244a.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.