Re-filters for PIM measurements and a test bench utilizing the same
US10403949B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Aug 2, 2018 |
| Grant date | Sep 3, 2019 |
| Priority date | — |
| Expiry date | Aug 2, 2038 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01P7/04
- WIPO fieldTelecommunications
- WIPO sectorElectrical engineering
Abstract
A PIM test bench including a first duplexer, having a first port connected via a first filter to a third port and a second port connected via a second filter to the third port. The first port is fed by signal sources providing RF signals at first and second frequencies. A spectrum analyzer is connected to the second port. A device under test is connected between said third port and a third port of a second duplexer. Each of the first and second ports of the second duplexer is connected to a PIM optimized load and/or a standard load. The second duplexer is preferably identical to the first duplexer. For minimizing self-intermodulation, at least the first duplexer comprises at least one filter component and a metal housing. The housing further includes a monolithic metal body and a metal cover capacitively coupled to the body without any galvanic contact.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.