Identifying sources of anomalies in multi-variable metrics using linearization
US10404777B2 · kind B2 · utility
2Cited by
3References
20Claims
0Family size
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Key dates
| Filing date | Oct 19, 2015 |
| Grant date | Sep 3, 2019 |
| Priority date | — |
| Expiry date | Oct 16, 2036 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04L67/02
- WIPO fieldDigital communication
- WIPO sectorElectrical engineering
Abstract
The present disclosure is directed toward systems and methods for identifying contributing factors associated with a multi-variable metric anomaly. One or more embodiments described herein identify one or more contributing factors that led to an anomaly in a multi-variable metric by calculating linearizing weights such that the total deviation in the multi-variable metric can be written as a weighted sum of deviations for dimension elements associated with the multi-variable metric.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.