Method for detecting defective pixels
US10404931B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Nov 5, 2015 |
| Grant date | Sep 3, 2019 |
| Priority date | — |
| Expiry date | Nov 5, 2035 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04N25/683
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
A defective-pixel detection method included in an image-processing procedure, including a pixel-processing procedure applied to pixels of an image supplied by an image sensor. Each pixel is associated with a classification value representing a state of said pixel. The method includes, for each pixel: applying the pixel-processing procedure; analyzing a result of the pixel-processing procedure; in the event of obtaining an unusual result representing a defect on a photosite of the image sensor that supplied said pixel, incrementing a number of detections of an unusual result for said pixel; and associating said pixel with a classification value representing a defective pixel when said number reaches a first threshold.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.