Corrected stack height calculation in an output bin
US10406844B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Apr 30, 2018 |
| Grant date | Sep 10, 2019 |
| Priority date | — |
| Expiry date | Apr 30, 2038 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG03G2215/00911
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
According to examples, an apparatus may include a processor and a memory. The memory may have stored thereon machine readable instructions that when executed by the processor, may cause the processor to determine a job thickness of a print job including sheets, determine an average sheet thickness of the sheets, and determine an average print material coverage on the sheets. The instructions may also cause the processor to identify, based on the determined job thickness, the determined average sheet thickness, and the average print material coverage, a plurality of correction factors to be applied in a calculation of a corrected stack height of print jobs in an output bin and apply the identified plurality of correction factors to a measured stack height in the output bin to calculate the corrected stack height.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.