Crystalline particle detection
US10408733B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jun 8, 2016 |
| Grant date | Sep 10, 2019 |
| Priority date | — |
| Expiry date | Jun 8, 2036 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2021/216
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method for determining the presence of crystalline silica particles in a sample comprising a plurality of particles. The method comprises: receiving first data generated based upon light scattered by at least one particle of said plurality of particles; receiving second data generated based upon intensity and polarization change of the light transmitted through at least one particle of said plurality of particles; and determining the presence of crystalline silica particles in the sample based upon the first data and second data.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.