Analysis method and analysis apparatus
US10408756B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jan 27, 2017 |
| Grant date | Sep 10, 2019 |
| Priority date | — |
| Expiry date | Nov 10, 2037 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2201/12
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
For an analysis method, a first specimen and a second specimen are prepared, in which different phthalate esters, for example DEHP and DINP, adhere in different states to a pair of predetermined base films, such as PVC, on metal plates. A metal reflection IR spectrum (P) and a metal reflection IR spectrum (Q) are acquired by radiating electromagnetic waves on the prepared first specimen and the second specimen respectively. Significantly different spectra are obtained for different phthalate esters, and the types of phthalate esters are identified by using such spectra.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.