Patent · US Active

Analysis method and analysis apparatus

US10408756B2 · kind B2 · utility

0Cited by
8References
14Claims
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Key dates

Filing dateJan 27, 2017
Grant dateSep 10, 2019
Priority date
Expiry dateNov 10, 2037

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01N2201/12
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

For an analysis method, a first specimen and a second specimen are prepared, in which different phthalate esters, for example DEHP and DINP, adhere in different states to a pair of predetermined base films, such as PVC, on metal plates. A metal reflection IR spectrum (P) and a metal reflection IR spectrum (Q) are acquired by radiating electromagnetic waves on the prepared first specimen and the second specimen respectively. Significantly different spectra are obtained for different phthalate esters, and the types of phthalate esters are identified by using such spectra.

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