Patent · US Active

Darkroom type security inspection apparatus and method

US10408804B2 · kind B2 · utility

0Cited by

0References

20Claims

0Family size

Assignees

TSINGHUA UNIVERSITY · CN
NUCTECH COMPANY LIMITED · CN

Inventors

Qingjun Zhang · Beijing, CN
Yuanjing Li · Beijing, CN
Zhiqiang Chen · Beijing, CN
Ziran Zhao · Beijing, CN
Weiping Zhu · Beijing, CN
Yaohong Liu · Beijing, CN
Qiufeng Ma · Beijing, CN
Xiang Zou · Beijing, CN
Huishao He · Beijing, CN
Jianping Chang · Beijing, CN
Song Liang · Shanghai, CN

Key dates

Filing date	Sep 26, 2016
Grant date	Sep 10, 2019
Priority date	—
Expiry date	Mar 14, 2037

Classification

Technology area (CPC G)Physics
CPC primaryG01N2030/8452
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

A darkroom type security inspection apparatus and a method of performing an inspection using the darkroom type security inspection apparatus. An apparatus includes a housing constituting a closed darkroom, and assemblies disposed inside the housing. The assemblies disposed inside the housing include: a sample collecting unit configured to collect a sample, a conveyor unit, and a X-ray detection unit to detect a position of the objected to be inspected, wherein the X-ray detection unit is configured to determine the position of the objected to be inspected within the sampling assembly so that the object to be inspected together with the conveyor unit is conveyed to an expected position; and a sample processing assembly, wherein the assemblies disposed inside the housing are communicated by fittings or connectors.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.