Method for calculating surface electric field distribution of nanostructures
US10408871B2 · kind B2 · utility
0Cited by
3References
12Claims
0Family size
Assignees
Inventors
Key dates
| Filing date | May 17, 2017 |
| Grant date | Sep 10, 2019 |
| Priority date | — |
| Expiry date | Nov 11, 2037 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R33/10
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The disclosure relates to a method for calculating surface electric field distribution of nanostructures. The method includes the following steps of: providing a nanostructure sample located on an insulated layer of a substrate; spraying first charged nanoparticles to the insulated surface; blowing vapor to the insulated surface and imaging the first charged nanoparticles via an optical microscope, recording the width w between the first charged nanoparticles and the nanostructure sample, and obtaining the voltage U of the nanostructure sample by an equation.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.