Apparatus for testing sample properties in a magnetic field
US10408891B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jul 15, 2014 |
| Grant date | Sep 10, 2019 |
| Priority date | — |
| Expiry date | Oct 9, 2035 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R33/1207
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A magnetic testing apparatus includes a magnet assembly with a sample path extending through the magnet assembly. The magnetic field produced by the magnet assembly defines a known, varying magnetic field profile along the sample path. A sample is moved along sample path such that the sample portion is subjected to a predetermined magnetic field ramp or magnetic field profile during a measurement period. A measurement arrangement is also provided to measure one or more properties of the sample during the measurement period, in order to test sample properties at a plurality of different magnetic fields. The apparatus may be particularly suited to magneto-optical measurements, including Magneto-Optical Kerr Effect measurements. The apparatus may be used for testing of hard disk platters.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.