Devices, systems, and methods for anomaly detection
US10410084B2 · kind B2 · utility
3Cited by
18References
20Claims
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Key dates
| Filing date | Oct 25, 2017 |
| Grant date | Sep 10, 2019 |
| Priority date | — |
| Expiry date | Nov 6, 2037 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/30164
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Devices, systems, and methods obtain a first image, obtain a second image, calculate respective distances between a histogram from a patch in the first image to respective histograms from patches in the second image, and identify a patch in the second image that is most similar to the patch in the first image based on the respective distances.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.