Direct measurement delay calibration method and apparatus
US10411719B1 · kind B1 · utility
Assignee
Inventor
Key dates
| Filing date | Jul 31, 2018 |
| Grant date | Sep 10, 2019 |
| Priority date | — |
| Expiry date | Jul 31, 2038 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH03K2005/00058
- WIPO fieldBasic communication processes
- WIPO sectorElectrical engineering
Abstract
Disclosed are methods and apparatuses for providing direct measurement delay calibration. An apparatus may include a plurality of delay elements in a loop. The apparatus may also include a controller coupled to the plurality of delay elements. The controller may be configured to cause determining, for a predetermined time period, delay oscillations from the plurality of delay elements in the loop. The controller may also be configured to cause determining, based on the determined delay oscillations, the predetermined time period, and a quantity of the plurality of delay elements, a subset of the plurality of delay elements for delaying an input signal. The controller may also be configured to cause routing the input signal through the subset of the plurality of delay elements.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.