Display substrate and method for testing the same, display apparatus
US10416812B2 · kind B2 · utility
Assignees
Inventors
Key dates
| Filing date | Mar 25, 2016 |
| Grant date | Sep 17, 2019 |
| Priority date | — |
| Expiry date | Aug 25, 2036 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG09G2330/12
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Embodiments of the invention provide display substrate, method for testing the same and display apparatus. The display substrate includes pixel regions arranged in matrix and test unit, each pixel region being provided with first electrode, wherein the test unit includes at least two test sub-units; first electrodes provided in adjacent pixel regions correspond to electrode block, and electrode blocks are electrically isolated from each other and divided, in accordance with their positions, into at least two test groups whose number is the same as that of the test sub-units; the electrode blocks of a same test group are provided spaced apart from each other in both row and column directions, and all the electrode blocks in the same test group are connected to one test sub-unit. The test unit can accurately test open or short defect existing in the display substrate, thereby improving test accuracy and lowering production costs.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.