Data processing system with built-in self-test and method therefor
US10417104B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Sep 22, 2015 |
| Grant date | Sep 17, 2019 |
| Priority date | — |
| Expiry date | Oct 30, 2035 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/318544
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A scan circuit and methods of operating a scan circuit are provided. The method for operating a scan circuit includes providing a first scan flip-flop which includes an overwrite feature. With the overwrite feature enabled, a change in functional behavior of the first scan flip-flop occurs based on a control signal. The method may further include capturing data at a first input of the first scan flip-flop during a first state of the control signal and resetting captured data by using the overwrite feature during a first transition of the control signal. The method may further include forming a scan chain with one or more of the first scan flip-flops and one or more second scan flip-flops. The second scan flip-flops may include a similar overwrite feature, having the overwrite feature disabled.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.