Correlation of stack segment intensity in emergent relationships
US10417111B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | May 5, 2017 |
| Grant date | Sep 17, 2019 |
| Priority date | — |
| Expiry date | Jul 2, 2037 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F2201/86
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Methods, systems and computer readable medium are provided for sequentially analyzing a series of thread dump samples to estimate the intensity statistic of newly classified stack segments of stack frames. According to one embodiment, a branch point along one or more linearly connected stack frames of a stack segment can be detected, where the stack segment is associated with one or more thread intensity statistic parameters. Upon detecting the branch point along the one or more linearly connected stack frames of the stack segment, the system can split the stack segment into a plurality of new stack segments that each include a subset of the stack frames, where the plurality of new stack segments are referenced by the stack segment. The system can then initialize the one or more thread intensity statistic parameters for each of the new stack segments.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.