Device and method for measuring three-dimensional shape
US10417472B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jan 8, 2015 |
| Grant date | Sep 17, 2019 |
| Priority date | — |
| Expiry date | May 29, 2035 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/20056
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A method for measuring a three-dimensional shape includes the steps of: forming a pattern on a light irradiated to an object from a light source unit installed in an electronic device by a pattern unit installed in the electronic device; generating image data by photographing the object to which the light on which the pattern is formed is irradiated by a camera unit installed in the electronic device; generating phase data for the object using the image data, and generating, using the phase data by a data generation unit, feature value data for a feature value of the object; and determining, by a determination unit, whether the feature value data is identical to pre-stored reference value data using the feature value data and the pre-stored reference value data.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.