Inspection system
US10417754B2 · kind B2 · utility
4Cited by
1References
16Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Mar 2, 2017 |
| Grant date | Sep 17, 2019 |
| Priority date | — |
| Expiry date | Jun 28, 2037 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2021/8887
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An inspection system is provided with an inspection device configured to examine the external features of an object; and a control device for controlling the inspection device;
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.